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Während in den sechziger Jahren
Appendix: The Radioisotope Radical Operation
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The Next Generation of Responsible Investment explores this topic in an edited volume intended for those with an interest in finance and business
Scanning Probe Microscopy Daniel W Während in den sechziger JahrenScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods