Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing formatIsbn:Softcover - 9783639814569 Methoden zur Anrechnung fiktiver Quellensteuern

Methoden zur Anrechnung fiktiver Quellensteuern

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Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing formatIsbn:Softcover - 9783639814569 Methoden zur Anrechnung fiktiver QuellensteuernMBE grown CdTe thin films were annealed in this study to decrease the number density of defects. For annealing, a system was designed and constructed. During anneals; anneal temperature, anneal time, anneal cycle and hydrogen gas effects were analyzed. The effects of annealing parameters were analyzed by SEM, AFM, Everson Etch method, resonance Raman spectroscopy, and Photoluminescence measurement. In our studies, dislocation density and Te